Finite element iterative techniques for determining the interface boundary between Laplace and Poisson domains—characteristic analysis of a field effect transistor

Two kinds of techniques for solving a shape determination problem are proposed. The determination of the interface boundary between two domains governed by Poisson and Laplace equations under the compatible and constraint condition is considered. Influence coefficient and inverse variational approaches are examined by using the iterative finite element procedure. A two‐dimensional model of a junction‐type field effect transistor is a test example. The determination of its interface boundary and the prediction of the potential distribution and static characteristic are demonstrated.