Synapse
⌘+K
Synapse
PulseExploreClubsResearchersJournals
Instagram
HomeClubsExplore
May 1, 1969Japanese Journal of Applied Physics

Continuous Ellipsometric Determination of the Optical Constants and Thickness of a Silver Film during Deposition

View Full Paper
Ask AI
Bookmark
Share

Authors

TYTomuo YamaguchiCentre National de la Recherche ScientifiqueSYSadafumi YoshidaNational Institute of Advanced Industrial Science and TechnologyAKAkira KINBARAThe University of Tokyo

Discussion

Loading...

Member takes

Implication

Key Points

Key points are not available for this paper at this time.

Cite This Study

Yamaguchi et al. (1969) studied this question.

synapsesocial.com/papers/6a962070baa8642ea89fe6c4https://doi.org/10.1143/jjap.8.559
View Full Paper
Ask AI
Bookmark
Share

Also Consider

Synapse has enriched 3 closely related papers on similar clinical questions. Consider them for comparative context:

  1. 1Measurement of the thickness and refractive index of very thin films and the optical properties of surfaces by ellipsometry1963 · 618 citations
  2. 2The Optical Constants of Thin Metallic Films Deposited by Evaporation1952 · 24 citations
  3. 3Photoelectric Measurement of Polarized Light by Means of an ADP Polarization Modulator I Photoelectric Polarimeter1961 · 25 citations