Correlation between open-circuit voltage and interface parameters at the AuCdS illuminated contact

Open circuit photovoltage has been measured at the illuminated junction between gold and cadmium sulfide polycrystalline layers. Interface states conditioned by surface preparation are shown to be vary important for the generation of a photovoltaic effect. Correlations have been found between photovoltage and contact parameters such as interfacial layer thickness, deduced from capacitance–voltage measurements, and barrier height φB at the junction given by standard current–voltage and Fowler photocurrent methods.