An investigation of order/disorder in a chromia‐doped rutile by high‐resolution electron microscopy

Summary Computer image simulations predict that the detailed atomic arrangements along extended CS defects in slightly‐reduced rutile may be identified in 500 kV high‐resolution electron micrographs. Experimental images from a chromia‐doped rutile have generally confirmed these predictions although also indicating that considerable disorder remains. The need for very careful control of sample preparation, including heat treatments, is emphasized.