High Resolution Electron Microscopic Studies of Crystallographic Shear Structures in Reduced Rutile Crystals

The crystallographic shear (CS) structures in reduced rutile crystals growing from micro-crystallites in vacuum-deposited amorphous films by electron beam heating have been investigated by means of the multi-beam lattice imaging technique and by the image simulation using the multi-slice method. A new type of the ordered CS structure represented by a (110) CS plane and a [011]/2 shear has been discovered in reduced TinO2n−1 crystals with n≤4. A crossed CS structure having the (110) CS planes by the [011]/2 shear and the (110) CS planes by the [011]/2 shear has been found in TimnO2mn−m−n+1 with m=n=2 and 4. A structure having the crossed CS planes, obtained by two partial CS operations of [011]/3·(110) and [011]/5·(110), has also been found in TiO.