Using a 1MHz length-extension type of quartz resonator as a force sensor for frequency-modulation atomic force microscopy (AFM), atomically resolved images of the Si(111)-(7×7) surface was obtained. Fabrications of a tip attached at the front end of the resonator by focused ion beam, and removal of the native oxide layer on the tip by in-situ field ion microscopy are found effective for achieving the highly-resolved AFM imaging.
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An et al. (2005) studied this question.
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