Etude de l'évolution structurale de polyoxyéthylènes pendant leur recuit

The annealing of two polyethyleneoxide samples has been studied by low‐angle X‐ray diffraction technique and dilatometry. At a given annealing temperature the long period is shown to increase stepwise. Several intermediate structures have been observed at different annealing temperatures. These results cast some doubt on the actual theories of annealing who predict a linear increasing‐thickness with the logarithm of annealing time.