Cadmium bis(O-alkylxanthates) are potential single-source molecular precursors for the chemical vapor deposition (CVD) of Cd(II) sulfide thin films. In this work, a multi-technique characterization of Cd(O-RXan)2 compounds [where O-RXan is CH3CH2OCS2 (O-EtXan) or (CH3)2CHOCS2 (O-iPrXan)] is performed by means of several analytical methods (extended x-ray absorption fine structure, Raman, Fourier transform infrared and optical absorption, spectroscopics 1H and 13C NMR, thermal analysis and mass spectrometry) for a thorough investigation of their structure and chemical–physical properties. The most important results concerning the chemical behavior under different experimental conditions, with particular attention to relevant properties for CVD applications, are presented and discussed.
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Barreca et al. (2005) studied this question.
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