An ultrasmall amplitude operation of dynamic force microscopy with second flexural mode

Selective detection of short-range interaction forces was carried out with the second flexural mode of a commercially available dynamic mode cantilever. A higher mode has a higher spring constant and a lower mechanical quality factor, which are suitable for the small amplitude operation in dynamic force microscopy. With 0.70Å amplitude of the second flexural mode, atomically resolved constant frequency shift images of the Si(111)−7×7 reconstructed surface were obtained. The ultrasmall amplitude operation enabled imaging with high stability, due to the detection of the interaction force gradients at relatively long distances from the sample surface, and is an effective way to observe reactive surfaces while avoiding modifications and damaging of the tip and the sample.