High-pressure–low-temperature x-ray power diffractometer

A high-pressure technique for x-ray diffraction studies at low temperatures is described. The system consists of a Bridgman anvil type high-pressure device with either tungsten carbide or boron carbide anvils, a liquid He cryostat, and x-ray diffractometer operating in Debye-Scherrer geometry. The newly developed boron carbide anvil cell is capable of containing a liquid pressure transmitting medium. The precision of the lattice parameter determination is discussed and the effect of nonisostatic stress components on the diffraction pattern is examined.