Answers are grounded in this paper and cite their sources.
Accurate yield optimization and statistical analysis of microwave components are crucial ingredients for manufacturability-driven designs in a time-to-market development environment. Yield optimization requires intensive simulations to cover the entire statistic of possible outcomes of a given manufacturing process. Performing direct yield optimization using accurate full-wave electromagnetic simulations does not appear feasible. In this article, an efficient procedure to realize electromagnetics (EM) based yield optimization and statistical analysis of microwave structures using space mapping-based neuromodels is proposed. Our technique is illustrated by the EM-based statistical analysis and yield optimization of a high temperature superconducting (HTS) microstrip filter.
No takes yet. Share an insight, caveat, or question.
Bandler et al. (2001) studied this question.
Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context: