This paper Presents numerical simulations, theoretical analysis, and millimeter wave experiments for scattering from one-dimensional very rough surfaces. First, numerical simulations are used to investigate the effects of roughness spectrum, height variation, interface medium, polarization, and incident angle on the backscattering enhancement. The enhanced backscattering due to rough surface scattering is divided into two cases; the RMS height close to a wavelength and RMS slope close to unity, and RMS height much smaller than a wavelength with surface wave contributions. Results also show that the enhancement is sensitive to the roughness spectrum. Next, a theory based on the first- and second-order Kirchhoff approximation modified with angular and propagation shadowing is developed. The theoretical solutions provide a physical explanation of backscattering enhancement and agree well with the numerical results. In addition to the scattering of a monochromatic wave, the analytical results of the broadening and lateral spreading of a pulsed beam wave scattering from rough surfaces are also discussed. Finally, the existence of backscattering enhancement from one-dimensional very rough conducting surfaces with exact Gaussian statistics and Gaussian roughness spectrum is verified by a millimeter-wave experiment. Experimental results which show enhanced backscattering for both TE and TM polarizations for different angles of incidence are presented.
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Ishimaru et al. (1991) studied this question.
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