A novel method yielding simultaneous information about location and orientation of the crystallites in a polycrystalline specimen has been developed and succesfully applied to the investigation of thin diamond films deposited on silicon. The experiment uses the parallel beam from a synchrotron radiation source and a microchannel plate as collimator in front of an image plate detector. Exposure times of only a few minutes could be realized. The spatial resolution was 0.375 mm but can easily be improved.
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Wroblewski et al. (1995) studied this question.
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