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May 5, 2003Chemistry - A European Journal

Constant‐Distance Mode Scanning Electrochemical Microscopy (SECM)—Part I: Adaptation of a Non‐Optical Shear‐Force‐Based Positioning Mode for SECM Tips

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Authors

BKBernardo Ballesteros KatemannRuhr University BochumASAlbert SchulteVidyasirimedhi Institute of Science and TechnologyWSWolfgang SchuhmannWrocław University of Science and Technology

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Katemann et al. (2003) studied this question.

synapsesocial.com/papers/6a970b7a132cd8a75e57aee8https://doi.org/10.1002/chem.200204267
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