We report on electrical noise measurements made on YBCO (Y1 Ba2 Cu3 O7−x ) films on SrTiO3, on bulk silicon with a ZrO2 buffer layer, and on thin dielectric membranes. We have found that 1/f noise predominates in the unoriented films and that thermal fluctuation noise is the chief source of noise in good films on SrTiO3 .
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Black et al. (1989) studied this question.
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