Femtosecond time-resolved dispersion relation of complex nonlinear refractive index in a semiconductor quantum well

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We present simultaneous measurement of femtosecond time-resolved nonlinear phase and amplitude changes around the excitonic resonance of the AlGaAs∕GaAs quantum well using polarization-division Sagnac interferometer. The nonlinear complex refractive index of the semiconductor material for all-optical devices is successfully determined from directly measured nonlinear phase and amplitude changes.