The photon-photon delayed coincidence technique is used to measure the lifetime; the value (6.21+or-0.10) ns is found. The measurements are obtained under conditions where pressure-dependent effects, as well as other known systematic errors, are negligible. A procedure for data analysis which has not previously been used with the present technique is employed. In this procedure, the apparatus response function is obtained directly and the measured time spectrum is deconvoluted using this response function to yield the lifetime.
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King et al. (1976) studied this question.
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