Optical constants of ZnO and ZnS near the band edges have been measured with an interference technique. Measurements on ZnO were performed on dielectric coated single crystals while those in ZnS were performed on thin films. Using a related method, we have also determined the refractive indices of insulating thin films of Ta 2 O 5 , Nb 2 O 5 , Si 3 N 4 , and a glow‐discharge deposited silicone polymer. The significant features are discussed and related to the work of others.
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Burgiel et al. (1968) studied this question.