Self-Heating-Induced Negative Bias Temperature Instability in Poly-Si TFTs under Dynamic Stress, Weng, Chi-Feng, Chang, Ting-Chang, Hsieh, Han-Po, Chen, Shih-Ching, Hsu, Wei-Che, Kuo, Wang-Chuang, Young, Tai-Fa
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Weng et al. (2008) studied this question.
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