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The low-angle scattering from individual grains of a fatigued polycrystalline copper foil 0.002 in. thick was studied in detail using a technique in which the specimen can be accurately oriented with respect to the beam and in which both large-angle and small-angle photographs can be obtained on the sane film. It is concluded that the low-angle scattering is caused by double Bragg reflection. (W.D.M.)
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Franks et al. (1958) studied this question.
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