A dual-cavity interrogation method used to enhance the unambiguous measurement range of in-fiber Bragg grating sensors with high-resolution interferometric wavelength-shift detection is described. This novel technique is based on the use of two sets of fringes obtained with a stepped interferometric wavelength scanner with dual cavity lengths. We demonstrate the concept by interrogating an in-fiber grating temperature sensor with a stepped Michelson wavelength scanner.
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Rao et al. (1996) studied this question.
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