SUMMARY Modern experimental techniques for static convergent beam electron microdiffraction in transmission electron microscopes are discussed and compared to the better known selected area electron microdiffraction methods. The effects of probe coherence are qualitatively discussed. Some recent applications of convergent beam microdiffraction to microstructural characterization of small particles, various lattice defects and amorphous solids are described.
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Carpenter et al. (1984) studied this question.
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