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High adhesion is often encountered at contact interfaces of miniaturized devices, known as microelectromechanical systems, due to the development of capillary, electrostatic, and van der Waals attractive forces. In addition, deformation of contacting asperities on opposing surfaces produces a repulsive interfacial force. Permanent surface adhesion (referred to as stiction) occurs when the total interfacial force is attractive and exceeds the micromachine restoring force. In the present study, a three-dimensional fractal topography description is incorporated into an elastic-plastic contact mechanics analysis of asperity deformation. Simulation results revealing the contribution of capillary, electrostatic, van der Waals, and asperity deformation forces to the total interfacial force are presented for silicon/silicon and aluminum/aluminum material systems and different mean surface separation distances. Results demonstrate a pronounced effect of surface roughness on the micromachine critical stiffness required to overcome interfacial adhesion.
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Komvopoulos et al. (1998) studied this question.
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