Multiple modes are directly imaged in a silicon nitride waveguide bend using near-field scanning optical microscopy. Since the high order mode attenuates faster than the fundamental mode, a transient interference is observed. Local loss at the bend-to-straight waveguide interface is found and attributed to modal mismatch. The observations are in good agreement with modal calculations using conformal index transformation.
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Yuan et al. (2005) studied this question.
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