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We study the effect of a dielectric film attached to the surface of a metal hole array (MHA) on the reflection spectrum in the terahertz (THz) region. The frequency of the reflection dip, attributed to the excitation of surface waves in the vicinity of the MHA surface, shifts to lower frequencies with increasing dielectric film thickness. This resonant characteristic of MHAs can be applied to highly sensitive THz sensing for samples attached to the MHA surface. We also investigate the dependence of the reflection spectrum on the MHA’s thickness and the side to which the dielectric film is attached.
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Miyamaru et al. (2010) studied this question.
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