Photoelectron spectroscopy and photoion-photoion coincidence technique are combined for the first time to show, in a molecule, the selectivity of electronic decay channels of resonances near a core edge. Tetramethylsilane is studied near the LII,III level of silicon, by use of monochromatized synchrotron radiation in the 100--120-eV range. Autoionization and simple and double-resonant Auger processes explain the formation of one-hole and multiple-hole excited configurations of the final ionic states.
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Morin et al. (1986) studied this question.
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