Methodological study demonstrates advanced orientation mapping in deformed polycrystals, highlighting enhanced detection of subtle structural deformation features.
Orientation information as obtained by electron back scattering diffraction in crystalline material is conventionally visualised in orientation maps with different colours representing different orientations. The possibility of resolving orientation inhomogeneities from such maps depends strongly on the selected colouring scheme. For gaining spatial information on the orientation distribution and retrieving orientation correlations within selected regions of an orientation map, an advanced evaluation scheme is presented. By determining the predominant rotation axis within individual grains of a deformed polycrystal and displaying the sign carrying disorientation angle, characteristic features of the deformation structure, as alternating orientation differences or orientation gradients, are resolved.
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Wolfgang Pantleon (2005) studied this question.
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