The spatial and temporal scaling behaviors of vapor-deposited silver films have been investigated by means of scanning tunneling microscopy for the film thickness range {}10-1000 nm. The roughness, growth, and dynamic scaling exponents have been independently measured (α=0.82±0.05,β=0.29±0.06, and z=2.5±0.5), and they exhibit no evolution with film thickness.
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Palasantzas et al. (1994) studied this question.
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