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October 1, 1975Journal of Applied Crystallography

X-ray diffraction techniques for the analysis of epitaxic thin films

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Authors

CWC. A. WallaceUniversity of Notre DameRWR. C. C. WardUniversity of Oxford

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Wallace et al. (1975) studied this question.

synapsesocial.com/papers/6a98d2cd1c4dac29babd424fhttps://doi.org/10.1107/s0021889875011235
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