Surface plasmon resonances at a [Ag/SiO2 helical thin-film] interface

This is the authors' abstract. We don't add key points for this paper.

Multiple surface plasmon resonances (SPRs) were observed in the [prism/Ag/SiO 2 helical thin-film] Kretschmann configuration with a p-polarized incident beam. Simulation shows that multiple SPRs occur only for SiO 2 helical film thicknesses greater than a period of 307 nm. Experimental results are in a good agreement with simulated results. Multiple SPRs may have more capabilities in sensing chemical and biological species than a conventional single SPR.