Metallization for crossbar molecular devices

Self-assembled organic monolayer nanopore crossbar junctions were fabricated as a test structure for molecular electronics. The device yield, which is typically very low due to electrical shorting on top electrode deposition, is studied for different deposition parameters, and a clear improvement (up to 45% yield) is obtained by indirect deposition of silver electrodes on cooled substrates. Nevertheless, the yield fluctuates strongly from run to run (∼8% to ∼45%), implying that reliable device fabrication remains challenging. We find a small number of devices (<1%) show switching behaviour in conductivity, presumably due to metal filaments.