We present a new characterization method for internal optical waveguide loss of blue, aquamarine, and green group-III–nitride laser diodes from as-grown wafers without need for further fabrication. This approach relies on excitation-position dependent polarization-resolved photoluminescence spectra collected from the edge of the planar waveguide. The high measurement accuracy of ±1 cm -1 enables for the first time determination of the mechanisms for p-layer optical loss from the waveguide loss difference before and after Mg dopant activation. Temperature-dependent measurements show that the dominant optical loss mechanism is absorption by acceptor-bound holes. This absorption mechanism does not depend significantly on light polarization.
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Sizov et al. (2010) studied this question.
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