The reduction of graphite oxide (GO) thin films was evaluated at 220 °C using a combination of infrared (FTIR) and X-ray photoemission spectroscopies (XPS). The results were correlated with electrical resistance measurements. The chemical composition of GO was C 8 (OH) 3 O 0.8 and reduced to C 8 (OH) 0.5 O 0.3 after nearly 24 h of low-temperature processing, defined as 220 °C. The sheet resistance of dropcast GO thin films processed at 220 °C in air was 8 kΩ sq −1, similar to GO reduced at >800 °C in an inert atmosphere.
No takes yet. Share an insight, caveat, or question.
Christopher D. Zangmeister (2010) studied this question.
Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context: