In this paper, we investigate the dependence of multipactor susceptibility charts of a parallel-plate dielectric-loaded waveguide on the different geometrical and electrical parameters of the waveguide under study. Susceptibility charts are obtained for different properties of the dielectric material loading the structure (i.e., different height, dielectric constant, and secondary emission yield (SEY) responses are considered). Realistic susceptibility charts are also computed employing experimental SEY measurements from different metallic and dielectric materials.
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Torregrosa‐Penalva et al. (2010) studied this question.
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