The changes produced in the electrical properties of cadmium sulphide thin films following oxygen adsorption and low energy ion bombardment are reported. High purity cadmium sulphide thin films were prepared in an ultra high vacuum evaporating chamber and conductivity tests and adsorption and bombardment investigations were carried out without exposing the samples to atmospheric contamination. Changes in the electrical properties of the thin film samples which can be directly attributed to either oxygen contamination or radiation damage at the surface, were observed.
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Hughes et al. (1968) studied this question.
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