It is shown that the atom-probe field-ion-microscope data does not give directly the true composition of a sample. A method is devised for converting the data to the true composition. We also report here the first ToF atom-probe study of surface segregation of Pt–5% Ru and Pt–8% W alloys. Using the new analysis the true composition depth profiles of the alloys are obtained with a single atomic layer resolution.
No takes yet. Share an insight, caveat, or question.
Tsong et al. (1978) studied this question.
Synapse has enriched 3 closely related papers on similar clinical questions. Consider them for comparative context: