Work is described on the fabrication of uncoated probe tips for reflection scanning near-field optical microscopes. A chemical etching process with a rotator, and a simple device to make the tips by a heating-pulling method without a heating laser are introduced. Both techniques allow some manipulation of the tips. Merits and demerits of these two methods are discussed. Finally, it is suggested that observation of the far field scattering pattern of the tips can be used to check the usefulness of the tips.
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Xiao et al. (1997) studied this question.
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