Measurement of the spectral distribution of a diffraction x‐ray tube with a solid‐state detector

A knowledge of the spectral distribution method emitted by an x‐ray tube is important for all calculations in quantitative x‐ray fluorescence analysis. A simple way of directly measuring the primary spectrum of an x‐ray tube with a solid‐state detector is presented. For samples which meet thin‐film criteria sensitivity factors based on the measured primary spectrum were calculated and compared with experimental values.