We present an investigation of MEMS breakdowns effects on the radiation pattern of a MEMS based reconfigurable reflectarray. In addition, a correction procedure is proposed to minimize phase errors due to breakdowns. It takes advantage of the numerous possibilities offered by the refectarray's cell to achieve a given phase shift. Furthermore, a systematic methodology is proposed to assess cell's robustness to breakdowns by defining a cumulative root mean square error accounting for any possible MEMS failure. It is shown to provide a convenient means of comparing different possible cell topologies. Finally, it is also used to minimize the number of MEMS in the cell while preserving the necessary redundancy to limit phase errors.
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Salti et al. (2010) studied this question.
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