We present a silicon-on-insulator Echelle grating 8-channel demutiplexer showing characteristic features, average insertion loss 2.4 dB measured at 1520~1570 nm, adjacent channel crosstalk 15-18 dB, and channel spacing 11.9 nm. Our Echelle grating is remarked by a total internal reflector (TIR) which reflects incident light by a single reflection in contrast to the double reflections of retro-reflector TIR Echelle gratings.
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Park et al. (2012) studied this question.
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