The results of measuring the magnetization M and magnetic susceptibility χ of Cd 1− x Zn x Te crystals are presented. The hysteresis of the M ( H ) dependence, which is caused by the presence of arbitrarily oriented magnetic clusters, is observed in magnetic fields H <2 kOe. Van Vlek paramagnetism, which is caused by electric fields of defects, makes a substantial contribution to the magnetic susceptibility. The anomalies in the χ( T ) dependence in the temperature region T <50 K are associated with variation in the charge state of interstitial Te for x =0.12. For x =0.21, these anomalies can be caused either by the paramagnetism of noninteracting defects or by antiferromagnetic ordering of the defect subsystem formed by Zn Cd and Te i . The effect of annealing on the magnetic state of a defect subsystem in the samples is ascertained.
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Shaldin et al. (2004) studied this question.
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