p-x imaging by localized slant stacks of t-x data

An image can be produced directly in the ray parameter-distance (p-x) plane from data in the travel time-distance plane by computing an overlapping sequence of local slant stacks. The centre of each local stack in the series is slightly displaced in x from the previous one. Processing of three synthetic data profiles shows that p-x images produced by localized stacking correspond with analytically determined p-x curves. Apparent phase velocities measured from post-critical reflection branches with an array contain systematic deviations related to the presence of an x-dependent intra-wavelet phase shift.