Measurements of the electrical resistivity of thin silver films prepared by evaporation on amorphous substrates in ultrahigh vacuum indicate partial specular reflection of the conduction electrons at the films' surfaces. Some correlation between the electrical resistivity and the structure of the deposited films was observed, and the influence of residual gases during the evaporation process on structure and properties of the films was investigated.
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Estermann et al. (1970) studied this question.
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