A novel two-tone measurement technique for characterizing distortion in optical phase modulators is proposed and demonstrated. The technique is used to characterize an InGaAsP-InP modulator in a monolithically integrated receiver. Results for forward and reverse bias conditions in the modulator show a phase IP3 of 7.2pi and 0.97pi rad, respectively
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Sysak et al. (2007) studied this question.
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