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The effect of cooling on the development of the altered layer in a Cu‐Pt alloy under Ar+ ion bombardment has been studied through the accurate determination of the compositional profiles in the near‐surface region by sequential ISS‐AES measurements and by a new method. Although the ISS‐AES measurements have not revealed any noticeable difference between the composition profiles at about −150°C and room temperature, a significant difference has been observed using the new method based on He+‐ISS monitoring of the surface composition under bombardment of mixed (Ar+ + He+) ions, followed by abrupt switching to bombardment with only He+ ions. The measurement procedures are described in detail, and the results obtained by both the techniques are discussed.
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Li et al. (1994) studied this question.
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