A technique to obtain high-resolution topographical information of particles in the Angstrom-size with a transmission electron microscope is described. This consists of obtaining dark-field images of particles which are tilted away from the Bragg angle and in a N-beam diffracting condition. The effective extinction distance is then substantially reduced and topographical analysis of the small crystallities can be obtained from Pendellösung fringes.
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T. Ocaña Z. (1977) studied this question.
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