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Optical quality thin films of CdSxSe1−x were deposited on quartz for various values of x. It was found that these films were polycrystalline in structure, with a high degree of orientation of the c axis. An empirical relationship between the band gap and the lattice constant for the binary system CdS-CdSe was also obtained.
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Kwok et al. (1988) studied this question.
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