A dielectric method to measure the twist elastic constant K2 was developed by directing the probing electric field in the direction perpendicular to the substrate normal. This in fact breaks the director degeneracy in the plane of the substrates in the case of a twist transition and enables one to observe the director reorientation at the twist transition. By probing the dielectric response of the cell, the twist Freedericksz transition threshold has been located and the elastic constant determined. The results agree very well with the data of a calibrated liquid-crystal material.
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Zili Li (1994) studied this question.
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