A theoretical model is proposed which describes a new physical micromechanism for relaxation of misfit stresses in crystalline films, namely the formation of misfit dislocation walls. Energetic characteristics of films with misfit dislocation walls are estimated and compared with those of films with `standard' misfit dislocation rows. Misfit dislocation walls are recognized as misfit defect configurations that can be formed, in particular, in films resulting from convergence of island films.
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I. A. Ovid’ko (1999) studied this question.
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