Plane-grating flat-field soft x-ray spectrometer

We describe a soft x-ray spectrometer covering the 120–800 eV range. It is intended for resonant inelastic x-ray scattering experiments performed at third generation synchrotron radiation (SR) facilities and has been developed with SOLEIL, the future French national SR source in mind. The Hettrick–Underwood principle is at the heart of the design using a combination of varied line-spacing plane grating and spherical-mirror to provide a flat-field image. It is slitless for optimum acceptance. This means the source size determines the resolving power. A spot size of ⩽5μm is planned at SOLEIL which, according to simulations, should ensure a resolving power ⩾1000 over the whole energy range. A 1024×1024 pixel charge-coupled device (CCD) with a 13μm×13μm pixel size is used. This is an improvement on the use of microchannel-plate detectors, both as concerns efficiency and spatial resolution. Additionally spectral line curvature is avoided by the use of a horizontal focusing mirror concentrating the beam in the nondispersing direction. It allows for readout using a binning mode to reduce the intrinsically large CCD readout noise. Preliminary results taken at beamlines at Elettra (Trieste) and at BESSY (Berlin) are presented.